Machine learning-based anomaly detection for post-silicon bug diagnosis

Andrew DeOrio, Qingkun Li, Matthew Burgess, Valeria Bertacco. Machine learning-based anomaly detection for post-silicon bug diagnosis. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 491-496, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]

Abstract

Abstract is missing.