Deep Learning-Based Leaf Detection for Robotic Physical Sampling with P-AgBot

Aarya Deb, Kitae Kim, David J. Cappelleri. Deep Learning-Based Leaf Detection for Robotic Physical Sampling with P-AgBot. In IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2023, Detroit, MI, USA, October 1-5, 2023. pages 8291-8297, IEEE, 2023. [doi]

Authors

Aarya Deb

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Kitae Kim

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David J. Cappelleri

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