A Metric of Tolerance for the Manufacturing Defects of Threshold Logic Gates - researchr publication authors

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Sandeep Dechu, Manoj Kumar Goparaju, Spyros Tragoudas. A Metric of Tolerance for the Manufacturing Defects of Threshold Logic Gates. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 318-326, IEEE Computer Society, 2006. [doi]

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