Sandeep Dechu, Manoj Kumar Goparaju, Spyros Tragoudas. A Metric of Tolerance for the Manufacturing Defects of Threshold Logic Gates. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 318-326, IEEE Computer Society, 2006. [doi]
@inproceedings{DechuGT06, title = {A Metric of Tolerance for the Manufacturing Defects of Threshold Logic Gates}, author = {Sandeep Dechu and Manoj Kumar Goparaju and Spyros Tragoudas}, year = {2006}, doi = {10.1109/DFT.2006.7}, url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.7}, tags = {logic}, researchr = {https://researchr.org/publication/DechuGT06}, cites = {0}, citedby = {0}, pages = {318-326}, booktitle = {21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-2706-X}, }