A new object based quality metric based on SIFT and SSIM - researchr publication authors

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Marc Decombas, Frédéric Dufaux, Erwann Renan, Béatrice Pesquet-Popescu, François Capman. A new object based quality metric based on SIFT and SSIM. In 19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012. pages 1493-1496, IEEE, 2012. [doi]

This author has not been identified. Look up 'Marc Decombas' in GoogleThis author has not been identified. Look up 'Frédéric Dufaux' in GoogleThis author has not been identified. Look up 'Erwann Renan' in GoogleThis author has not been identified. Look up 'Béatrice Pesquet-Popescu' in GoogleThis author has not been identified. Look up 'François Capman' in Google

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