Marc Decombas, Frédéric Dufaux, Erwann Renan, Béatrice Pesquet-Popescu, François Capman. A new object based quality metric based on SIFT and SSIM. In 19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012. pages 1493-1496, IEEE, 2012. [doi]
@inproceedings{DecombasDRPC12-0,
title = {A new object based quality metric based on SIFT and SSIM},
author = {Marc Decombas and Frédéric Dufaux and Erwann Renan and Béatrice Pesquet-Popescu and François Capman},
year = {2012},
doi = {10.1109/ICIP.2012.6467154},
url = {http://dx.doi.org/10.1109/ICIP.2012.6467154},
researchr = {https://researchr.org/publication/DecombasDRPC12-0},
cites = {0},
citedby = {0},
pages = {1493-1496},
booktitle = {19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2534-9},
}