Marc Decombas, Frédéric Dufaux, Erwann Renan, Béatrice Pesquet-Popescu, François Capman. A new object based quality metric based on SIFT and SSIM. In 19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012. pages 1493-1496, IEEE, 2012. [doi]
Abstract is missing.