Leveraging Partially Enhanced Scan for Improved Observability in Delay Fault Testing - researchr publication authors

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K. G. Deepak, Robinson Reyna, Virendra Singh, Adit D. Singh. Leveraging Partially Enhanced Scan for Improved Observability in Delay Fault Testing. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 237-240, IEEE Computer Society, 2009. [doi]

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