K. G. Deepak, Robinson Reyna, Virendra Singh, Adit D. Singh. Leveraging Partially Enhanced Scan for Improved Observability in Delay Fault Testing. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 237-240, IEEE Computer Society, 2009. [doi]
@inproceedings{DeepakRSS09,
title = {Leveraging Partially Enhanced Scan for Improved Observability in Delay Fault Testing},
author = {K. G. Deepak and Robinson Reyna and Virendra Singh and Adit D. Singh},
year = {2009},
doi = {10.1109/ATS.2009.78},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.78},
tags = {testing},
researchr = {https://researchr.org/publication/DeepakRSS09},
cites = {0},
citedby = {0},
pages = {237-240},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3864-8},
}