3-D NAND Flash Value-Aware SSD: Error-Tolerant SSD Without ECCs for Image Recognition

Yoshiaki Deguchi, Toshiki Nakamura, Atsuna Hayakawa, Ken Takeuchi. 3-D NAND Flash Value-Aware SSD: Error-Tolerant SSD Without ECCs for Image Recognition. J. Solid-State Circuits, 54(6):1800-1811, 2019. [doi]

Authors

Yoshiaki Deguchi

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Toshiki Nakamura

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Atsuna Hayakawa

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Ken Takeuchi

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