Yoshiaki Deguchi, Toshiki Nakamura, Atsuna Hayakawa, Ken Takeuchi. 3-D NAND Flash Value-Aware SSD: Error-Tolerant SSD Without ECCs for Image Recognition. J. Solid-State Circuits, 54(6):1800-1811, 2019. [doi]
@article{DeguchiNHT19,
title = {3-D NAND Flash Value-Aware SSD: Error-Tolerant SSD Without ECCs for Image Recognition},
author = {Yoshiaki Deguchi and Toshiki Nakamura and Atsuna Hayakawa and Ken Takeuchi},
year = {2019},
doi = {10.1109/JSSC.2019.2900866},
url = {https://doi.org/10.1109/JSSC.2019.2900866},
researchr = {https://researchr.org/publication/DeguchiNHT19},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {54},
number = {6},
pages = {1800-1811},
}