High temperature reliability testing of aluminum and tantalum electrolytic capacitors

A. Dehbi, W. Wondrak, Y. Ousten, Y. Danto. High temperature reliability testing of aluminum and tantalum electrolytic capacitors. Microelectronics Reliability, 42(6):835-840, 2002. [doi]

Authors

A. Dehbi

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W. Wondrak

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Y. Ousten

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Y. Danto

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