A. Dehbi, W. Wondrak, Y. Ousten, Y. Danto. High temperature reliability testing of aluminum and tantalum electrolytic capacitors. Microelectronics Reliability, 42(6):835-840, 2002. [doi]
@article{DehbiWOD02,
title = {High temperature reliability testing of aluminum and tantalum electrolytic capacitors},
author = {A. Dehbi and W. Wondrak and Y. Ousten and Y. Danto},
year = {2002},
doi = {10.1016/S0026-2714(02)00021-5},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00021-5},
tags = {testing, reliability},
researchr = {https://researchr.org/publication/DehbiWOD02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {6},
pages = {835-840},
}