Mutation-based diagnostic test generation for hardware design error diagnosis - researchr publication authors

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Shujun Deng, Kwang-Ting Cheng, Jinian Bian, Zhiqiu Kong. Mutation-based diagnostic test generation for hardware design error diagnosis. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 815, IEEE, 2010. [doi]

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