Shujun Deng, Kwang-Ting Cheng, Jinian Bian, Zhiqiu Kong. Mutation-based diagnostic test generation for hardware design error diagnosis. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 815, IEEE, 2010. [doi]
@inproceedings{DengCBK10, title = {Mutation-based diagnostic test generation for hardware design error diagnosis}, author = {Shujun Deng and Kwang-Ting Cheng and Jinian Bian and Zhiqiu Kong}, year = {2010}, doi = {10.1109/TEST.2010.5699307}, url = {http://dx.doi.org/10.1109/TEST.2010.5699307}, researchr = {https://researchr.org/publication/DengCBK10}, cites = {0}, citedby = {0}, pages = {815}, booktitle = {2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010}, editor = {Ron Press and Erik H. Volkerink}, publisher = {IEEE}, isbn = {978-1-4244-7206-2}, }