A 22nm Variation-Tolerant Clock Duty-Cycle Controller for Mitigating Aging-Induced Clock Duty-Cycle Distortion with Path Replica - researchr publication authors

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Lishuo Deng, Zhiting Li, Changwei Yan, Junyi Qian, Cai Li, Ruidong Li, Tuo Li, Weiwei Shan. A 22nm Variation-Tolerant Clock Duty-Cycle Controller for Mitigating Aging-Induced Clock Duty-Cycle Distortion with Path Replica. In IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2024, Hangzhou, China, October 25-27, 2024. pages 23-24, IEEE, 2024. [doi]

This author has not been identified. Look up 'Lishuo Deng' in GoogleThis author has not been identified. Look up 'Zhiting Li' in GoogleThis author has not been identified. Look up 'Changwei Yan' in GoogleThis author has not been identified. Look up 'Junyi Qian' in GoogleThis author has not been identified. Look up 'Cai Li' in GoogleThis author has not been identified. Look up 'Ruidong Li' in GoogleThis author has not been identified. Look up 'Tuo Li' in GoogleThis author has not been identified. Look up 'Weiwei Shan' in Google

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