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A 22nm Variation-Tolerant Clock Duty-Cycle Controller for Mitigating Aging-Induced Clock Duty-Cycle Distortion with Path Replica

Lishuo Deng, Zhiting Li, Changwei Yan, Junyi Qian, Cai Li, Ruidong Li, Tuo Li, Weiwei Shan. A 22nm Variation-Tolerant Clock Duty-Cycle Controller for Mitigating Aging-Induced Clock Duty-Cycle Distortion with Path Replica. In IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2024, Hangzhou, China, October 25-27, 2024. pages 23-24, IEEE, 2024. [doi]

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