Lishuo Deng, Zhiting Li, Changwei Yan, Junyi Qian, Cai Li, Ruidong Li, Tuo Li, Weiwei Shan. A 22nm Variation-Tolerant Clock Duty-Cycle Controller for Mitigating Aging-Induced Clock Duty-Cycle Distortion with Path Replica. In IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2024, Hangzhou, China, October 25-27, 2024. pages 23-24, IEEE, 2024. [doi]
@inproceedings{DengLYQLLLS24,
title = {A 22nm Variation-Tolerant Clock Duty-Cycle Controller for Mitigating Aging-Induced Clock Duty-Cycle Distortion with Path Replica},
author = {Lishuo Deng and Zhiting Li and Changwei Yan and Junyi Qian and Cai Li and Ruidong Li and Tuo Li and Weiwei Shan},
year = {2024},
doi = {10.1109/ICTA64028.2024.10860572},
url = {https://doi.org/10.1109/ICTA64028.2024.10860572},
researchr = {https://researchr.org/publication/DengLYQLLLS24},
cites = {0},
citedby = {0},
pages = {23-24},
booktitle = {IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2024, Hangzhou, China, October 25-27, 2024},
publisher = {IEEE},
isbn = {979-8-3315-3072-3},
}