Adaptive Test for Mixed-Signal Chips Based on Information Gain and Backpropagation Neural Network

Kewei Deng, Houjun Wang, Pu Pu, En-Xiao Liu, Zhenyu Zhao 0001. Adaptive Test for Mixed-Signal Chips Based on Information Gain and Backpropagation Neural Network. IEEE Trans. VLSI Syst., 34(5):1645-1655, May 2026. [doi]

Abstract

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