Li-Ming Denq, Rei-Fu Huang, Cheng-Wen Wu, Yeong-Jar Chang, Wen Ching Wu. A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories. In 12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA. pages 65-69, IEEE Computer Society, 2004. [doi]
@inproceedings{DenqHWCW04,
title = {A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories},
author = {Li-Ming Denq and Rei-Fu Huang and Cheng-Wen Wu and Yeong-Jar Chang and Wen Ching Wu},
year = {2004},
doi = {10.1109/MTDT.2004.3},
url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2004.3},
tags = {diagnostics},
researchr = {https://researchr.org/publication/DenqHWCW04},
cites = {0},
citedby = {0},
pages = {65-69},
booktitle = {12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2193-2},
}