Fine grained multi-threshold CMOS for enhanced leakage reduction

Harmander Deogun, Dennis Sylvester, Kevin J. Nowka. Fine grained multi-threshold CMOS for enhanced leakage reduction. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]

Authors

Harmander Deogun

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Dennis Sylvester

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Kevin J. Nowka

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