Fine grained multi-threshold CMOS for enhanced leakage reduction

Harmander Deogun, Dennis Sylvester, Kevin J. Nowka. Fine grained multi-threshold CMOS for enhanced leakage reduction. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]

@inproceedings{DeogunSN06,
  title = {Fine grained multi-threshold CMOS for enhanced leakage reduction},
  author = {Harmander Deogun and Dennis Sylvester and Kevin J. Nowka},
  year = {2006},
  doi = {10.1109/ISCAS.2006.1693468},
  url = {http://dx.doi.org/10.1109/ISCAS.2006.1693468},
  researchr = {https://researchr.org/publication/DeogunSN06},
  cites = {0},
  citedby = {0},
  booktitle = {International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece},
  publisher = {IEEE},
}