An Embedded Test Circuit for RF Single Ended Low Noise Amplifiers

Lampros Dermentzoglou, Anastasios Karagounis, Aggeliki Arapoyanni, Yiorgos Tsiatouhas. An Embedded Test Circuit for RF Single Ended Low Noise Amplifiers. In 14th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2007, Marrakech, Morocco, December 11-14, 2007. pages 1119-1122, IEEE, 2007. [doi]

Abstract

Abstract is missing.