Bulent I. Dervisoglu. Features of a Scan and Clock Resource chip for providing access to board-level test functions. J. Electronic Testing, 2(1):107-115, 1991. [doi]
@article{Dervisoglu91,
title = {Features of a Scan and Clock Resource chip for providing access to board-level test functions},
author = {Bulent I. Dervisoglu},
year = {1991},
doi = {10.1007/BF00134947},
url = {http://dx.doi.org/10.1007/BF00134947},
tags = {testing},
researchr = {https://researchr.org/publication/Dervisoglu91},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {2},
number = {1},
pages = {107-115},
}