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Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling

Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari. Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectronics Reliability, 43(9-11):1663-1668, 2003. [doi]

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Romain Desplats

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A. Eral

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Felix Beaudoin

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Philippe Perdu

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Alan J. Weger

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Moyra K. McManus

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Peilin Song

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Franco Stellari

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