Suresh Kumar Devanathan, Michael L. Bushnell. Test Pattern Generation Using Modulation by Haar Wavelets and Correlation for Sequential BIST. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 485-491, IEEE Computer Society, 2007. [doi]
Abstract is missing.