V. R. Devanathan, Alan Hales, Sumant Kale, Dharmesh Sonkar. Towards effective and compression-friendly test of memory interface logic. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 124-133, IEEE, 2010. [doi]
@inproceedings{DevanathanHKS10,
title = {Towards effective and compression-friendly test of memory interface logic},
author = {V. R. Devanathan and Alan Hales and Sumant Kale and Dharmesh Sonkar},
year = {2010},
doi = {10.1109/TEST.2010.5699212},
url = {http://dx.doi.org/10.1109/TEST.2010.5699212},
researchr = {https://researchr.org/publication/DevanathanHKS10},
cites = {0},
citedby = {0},
pages = {124-133},
booktitle = {2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010},
editor = {Ron Press and Erik H. Volkerink},
publisher = {IEEE},
isbn = {978-1-4244-7206-2},
}