V. R. Devanathan, Alan Hales, Sumant Kale, Dharmesh Sonkar. Towards effective and compression-friendly test of memory interface logic. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 124-133, IEEE, 2010. [doi]
Abstract is missing.