Dynamic test signal design for analog ICs

Giri Devarayanadurg, Mani Soma. Dynamic test signal design for analog ICs. In Richard L. Rudell, editor, Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995, San Jose, California, USA, November 5-9, 1995. pages 627-630, IEEE Computer Society, 1995. [doi]

Abstract

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