Gate-level autonomous watchdog circuit for error robustness based on a 65nm self synchronous system - researchr publication authors

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Benjamin Stefan Devlin, Makoto Ikeda, Kunihiro Asada. Gate-level autonomous watchdog circuit for error robustness based on a 65nm self synchronous system. In 18th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2011, Beirut, Lebanon, December 11-14, 2011. pages 53-56, IEEE, 2011. [doi]

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