Benjamin Stefan Devlin, Makoto Ikeda, Kunihiro Asada. Gate-level autonomous watchdog circuit for error robustness based on a 65nm self synchronous system. In 18th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2011, Beirut, Lebanon, December 11-14, 2011. pages 53-56, IEEE, 2011. [doi]
@inproceedings{DevlinIA11-1,
title = {Gate-level autonomous watchdog circuit for error robustness based on a 65nm self synchronous system},
author = {Benjamin Stefan Devlin and Makoto Ikeda and Kunihiro Asada},
year = {2011},
doi = {10.1109/ICECS.2011.6122212},
url = {http://dx.doi.org/10.1109/ICECS.2011.6122212},
researchr = {https://researchr.org/publication/DevlinIA11-1},
cites = {0},
citedby = {0},
pages = {53-56},
booktitle = {18th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2011, Beirut, Lebanon, December 11-14, 2011},
publisher = {IEEE},
isbn = {978-1-4577-1845-8},
}