Thierry Devoivre, Richard Rouse, Nishath Verghese, Philippe Hurat. Modeling and Validation of Silicon Contour-Based Extraction and Simulation of Non-Uniform Devices. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 615-618, IEEE, 2007. [doi]
@inproceedings{DevoivreRVH07,
title = {Modeling and Validation of Silicon Contour-Based Extraction and Simulation of Non-Uniform Devices},
author = {Thierry Devoivre and Richard Rouse and Nishath Verghese and Philippe Hurat},
year = {2007},
doi = {10.1109/CICC.2007.4405807},
url = {http://dx.doi.org/10.1109/CICC.2007.4405807},
researchr = {https://researchr.org/publication/DevoivreRVH07},
cites = {0},
citedby = {0},
pages = {615-618},
booktitle = {Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007},
publisher = {IEEE},
isbn = {978-1-4244-1623-3},
}