Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis

Sabyasachi Deyati, Aritra Banerjee, Abhijit Chatterjee. Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis. In 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012. pages 142-145, IEEE Computer Society, 2012. [doi]

Authors

Sabyasachi Deyati

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Aritra Banerjee

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Abhijit Chatterjee

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