Sabyasachi Deyati, Aritra Banerjee, Abhijit Chatterjee. Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis. In 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012. pages 142-145, IEEE Computer Society, 2012. [doi]
Abstract is missing.