Sabyasachi Deyati, Aritra Banerjee, Abhijit Chatterjee. Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis. In 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012. pages 142-145, IEEE Computer Society, 2012. [doi]
@inproceedings{DeyatiBC12, title = {Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis}, author = {Sabyasachi Deyati and Aritra Banerjee and Abhijit Chatterjee}, year = {2012}, doi = {10.1109/IOLTS.2012.6313860}, url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2012.6313860}, researchr = {https://researchr.org/publication/DeyatiBC12}, cites = {0}, citedby = {0}, pages = {142-145}, booktitle = {18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012}, publisher = {IEEE Computer Society}, isbn = {978-1-4673-2082-5}, }