Sabyasachi Deyati, Barry John Muldrey, Aritra Banerjee, Abhijit Chatterjee. Atomic model learning: A machine learning paradigm for post silicon debug of RF/analog circuits. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.