Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee. Adaptive testing of analog/RF circuits using hardware extracted FSM models. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-6, IEEE Computer Society, 2016. [doi]
Abstract is missing.