Sonia Ben Dhia, Alexandre Boyer. Electro-magnetic robustness of integrated circuits: from statement to prediction. In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013. pages 208-213, IEEE, 2013. [doi]
@inproceedings{DhiaB13-0,
title = {Electro-magnetic robustness of integrated circuits: from statement to prediction},
author = {Sonia Ben Dhia and Alexandre Boyer},
year = {2013},
doi = {10.1109/EMCCompo.2013.6735202},
url = {https://doi.org/10.1109/EMCCompo.2013.6735202},
researchr = {https://researchr.org/publication/DhiaB13-0},
cites = {0},
citedby = {0},
pages = {208-213},
booktitle = {9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013},
publisher = {IEEE},
}