IC immunity modeling process validation using on-chip measurements - researchr publication authors

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Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro. IC immunity modeling process validation using on-chip measurements. In 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. pages 1-6, IEEE, 2011. [doi]

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