Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro. IC immunity modeling process validation using on-chip measurements. In 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. pages 1-6, IEEE, 2011. [doi]
@inproceedings{DhiaBVD11,
title = {IC immunity modeling process validation using on-chip measurements},
author = {Sonia Ben Dhia and Alexandre Boyer and Bertrand Vrignon and Mikaël Deobarro},
year = {2011},
doi = {10.1109/LATW.2011.5985912},
url = {https://doi.org/10.1109/LATW.2011.5985912},
researchr = {https://researchr.org/publication/DhiaBVD11},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011},
publisher = {IEEE},
isbn = {978-1-4577-1490-0},
}