Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler, Mehdi Dehbashi, Ulrike Pfannkuchen. Constraint-Based Pattern Retargeting for Reducing Localized Power Activity During Testing. In 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2018, Budapest, Hungary, April 25-27, 2018. pages 79-84, IEEE, 2018. [doi]
Abstract is missing.