Critical area driven dummy fill insertion to improve manufacturing yield - researchr publication authors

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Nishant Dhumane, Sandip Kundu. Critical area driven dummy fill insertion to improve manufacturing yield. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 334-341, IEEE, 2012. [doi]

This author has not been identified. Look up 'Nishant Dhumane' in GoogleThis author has not been identified. Look up 'Sandip Kundu' in Google

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