Nishant Dhumane, Sandip Kundu. Critical area driven dummy fill insertion to improve manufacturing yield. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 334-341, IEEE, 2012. [doi]
@inproceedings{DhumaneK12,
title = {Critical area driven dummy fill insertion to improve manufacturing yield},
author = {Nishant Dhumane and Sandip Kundu},
year = {2012},
doi = {10.1109/ISQED.2012.6187514},
url = {http://dx.doi.org/10.1109/ISQED.2012.6187514},
researchr = {https://researchr.org/publication/DhumaneK12},
cites = {0},
citedby = {0},
pages = {334-341},
booktitle = {Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012},
editor = {Keith A. Bowman and Kamesh V. Gadepally and Pallab Chatterjee and Mark M. Budnik and Lalitha Immaneni},
publisher = {IEEE},
isbn = {978-1-4673-1034-5},
}