Nishant Dhumane, Sandip Kundu. Critical area driven dummy fill insertion to improve manufacturing yield. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 334-341, IEEE, 2012. [doi]
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