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Exploiting process variation for retention induced refresh minimization on flash memory

Yejia Di, Liang Shi, Kaijie Wu, Chun Jason Xue. Exploiting process variation for retention induced refresh minimization on flash memory. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 391-396, IEEE, 2016. [doi]

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Yejia Di

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Liang Shi

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Kaijie Wu

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Chun Jason Xue

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