Yejia Di, Liang Shi, Kaijie Wu, Chun Jason Xue. Exploiting process variation for retention induced refresh minimization on flash memory. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 391-396, IEEE, 2016. [doi]
@inproceedings{DiSWX16,
title = {Exploiting process variation for retention induced refresh minimization on flash memory},
author = {Yejia Di and Liang Shi and Kaijie Wu and Chun Jason Xue},
year = {2016},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7459342},
researchr = {https://researchr.org/publication/DiSWX16},
cites = {0},
citedby = {0},
pages = {391-396},
booktitle = {2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016},
editor = {Luca Fanucci and Jürgen Teich},
publisher = {IEEE},
isbn = {978-3-9815-3707-9},
}