From system level to defect-oriented test: a case study - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira. From system level to defect-oriented test: a case study. In 4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999. pages 136-141, IEEE Computer Society, 1999. [doi]

This author has not been identified. Look up 'Octávio Páscoa Dias' in GoogleThis author has not been identified. Look up 'Jorge Semião' in GoogleThis author has not been identified. Look up 'Marcelino B. Santos' in GoogleThis author has not been identified. Look up 'Isabel Maria Cacho Teixeira' in GoogleThis author has not been identified. Look up 'João Paulo Teixeira' in Google

runs on WebDSL