Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira. From system level to defect-oriented test: a case study. In 4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999. pages 136-141, IEEE Computer Society, 1999. [doi]
@inproceedings{DiasSSTT99,
title = {From system level to defect-oriented test: a case study},
author = {Octávio Páscoa Dias and Jorge Semião and Marcelino B. Santos and Isabel Maria Cacho Teixeira and João Paulo Teixeira},
year = {1999},
doi = {10.1109/ETW.1999.804509},
url = {https://doi.org/10.1109/ETW.1999.804509},
researchr = {https://researchr.org/publication/DiasSSTT99},
cites = {0},
citedby = {0},
pages = {136-141},
booktitle = {4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999},
publisher = {IEEE Computer Society},
isbn = {0-7695-0390-X},
}