Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira. From system level to defect-oriented test: a case study. In 4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999. pages 136-141, IEEE Computer Society, 1999. [doi]
Abstract is missing.