Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems Architectures

Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira. Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems Architectures. J. Electronic Testing, 14(1-2):149-158, 1999. [doi]

Abstract

Abstract is missing.